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DANTE Industrial Controlling Cluster

Industrial controlling cluster DANTE is designed for parallel functional and durability testing of products during manufacturing. Product testing is individually controlled by cards, which form a cluster.

Controlling cards have programmable I/O ports of different voltage levels: 230 V AC/DC, 24 V AC/DC, 5–30 V DC, 0–10 V Ain, RTDtemp.in, etc. They are assigned to a testing protocol, executed locally by the card’s processor. Clusters are linked into a chain and to the computer running the supervision program. With the PC we define and download the test protocol, monitor and manipulate the performance of the tested product, keep statistics, do sorting or product binning. Key test parameters can be viewed on each cluster’s display.